Optomechanische AFM-Sonde für Photothermische Sensorik

Optomechanical AFM Probe for Nanoscale Photothermal Sensing

Yide Zhang (ORCID: 0000-0002-2675-739X)

Wissenschaftsdisziplinen

Chemie (50%); Mathematik (10%); Nanotechnologie (40%)

Keywords

    AFM-IR, Optomechanical Afm Probe, High Frequency Cantilever, Transient Photothermal Measurement, Nanoscale Thermal Metrology, 2D materials

Forschungsstätte(n)
  • Cork Institute of Technology - 100%